Reliability analysis for digital circuits

Contact: Alessandro Bernardini, Shushanik Karapetyan

Robustness Analysis

Robust system design is becoming increasingly important, because of the ongoing miniaturization of integrated circuits, the increasing effects of aging mechanisms, and the effects of parasitic elements, both intrinsic and external.
However, the complexity of contemporary systems makes it difficult to fulfill tight specifications. For this reason, robustness must be integrated into a partially automated design flow.

Resilient Cross-Layer Design

While there has been a considerable amount of work to handle issues like process variability, soft errors and aging at the gate and circuit levels, methods at the software and system levels have received considerably less attention. Further, the interaction between the system and circuit levels - in order to improve the techniques at both levels - is still mostly unexplored.
Filling this gap requires models for technology abstraction which accurately characterize the error/variability causes at the circuit level while taking system level design
decisions like operating frequency into account.
Resilient system level design methods have to utilize such models to provide additional design decisions and accurately characterize the possible tradeoff between reliability, performance and power.

Selected Publications

Andreas Herkersdorf, Hananeh Aliee, Michael Engel, Michael Glaß, Christina Gimmler-Dumont, Jörg Henkel, Veit B. Kleeberger, Michael A. Kochte, Johannes M. Kühn, Daniel Mueller-Gritschneder, Sani R. Nassif, Holm Rauchfuss, Wolfgang Rosenstiel, Ulf Schlichtmann, Muhammad Shafique, Mehdi B. Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis, Hans-Joachim Wunderlich
Resilience Articulation Point (RAP): Cross-layer Dependability Modeling for Nanometer System-on-chip Resilience
Microelectronics Reliability 54(6-7), 1066-1074
June 2014

Martin Barke, Michael Kaergel, Markus Olbrich, Ulf Schlichtmann
Robustness Measurement of Integrated Circuits and its Adaptation to Aging Effects
Microelectronics Reliability 54(6-7), 1058-1065
June 2014

Ulf Schlichtmann, Veit B. Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert Wehn
Connecting Different Worlds – Technology Abstraction for Reliability-Aware Design and Test
In: Design, Automation and Test in Europe (DATE)
March 2014

Veit B. Kleeberger, Christina Gimmler-Dumont, Christian Weis, Andreas Herkersdorf, Daniel Mueller-Gritschneder, Sani R. Nassif, Ulf Schlichtmann, Norbert Wehn
A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience
IEEE Micro 33(4)
July 2013

Georg Georgakos, Ulf Schlichtmann, Reinhard Schneider, Samarjit Chakraborty
Reliability Challenges for Electric Vehicles: From Devices to Architecture and Systems Software
In: ACM/IEEE Design Automation Conference (DAC)
June 2013